Článek v odborném periodiku

Haindl M., Grim J., Mikeš S.

Lecture Notes in Computer Science

2007

987-994

0302-9743

prof. Ing. Michal Haindl, DrSc. (ÚTIA - Oddělení rozpoznávání obrazů)

texture, defect detection, Markov random fields

This paper presents a fast multispectral texture defect detection method based on the underlying three-dimensional spatial probabilistic image model. The model first adaptively learns its parameters on the flawless texture part and subsequently checks for texture defects using the recursive prediction analysis. We provide colour textile defect detection results that indicate the advantages of the proposed method.