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<bibitem type="C">   <ARLID>0346562</ARLID> <utime>20240103193759.1</utime><mtime>20100907235959.9</mtime>    <DOI>10.1109/ICPR.2010.442</DOI>           <title language="eng" primary="1">A Compound MRF Texture Model</title>  <specification> <page_count>4 s.</page_count> </specification>    <serial><ARLID>cav_un_epca*0346559</ARLID><ISBN>978-1-4244-7542-1</ISBN><ISSN>1051-4651</ISSN><title>20th   International Conference on Pattern Recognition</title><part_num/><part_title/><page_num>1792-1795</page_num><publisher><place>Los Alamitos</place><name>IEEE Computer Society CPS</name><year>2010</year></publisher></serial>    <keyword>compound Markov random field</keyword>   <keyword>bidirectional texture function</keyword>    <author primary="1"> <ARLID>cav_un_auth*0101093</ARLID> <name1>Haindl</name1> <name2>Michal</name2> <full_dept language="cz">Rozpoznávání obrazu</full_dept> <full_dept language="eng">Department of Pattern Recognition</full_dept> <department language="cz">RO</department> <department language="eng">RO</department> <institution>UTIA-B</institution> <full_dept>Department of Pattern Recognition</full_dept>  <fullinstit>Ústav teorie informace a automatizace AV ČR, v. v. i.</fullinstit> </author> <author primary="0"> <ARLID>cav_un_auth*0101100</ARLID> <name1>Havlíček</name1> <name2>Vojtěch</name2> <full_dept language="cz">Rozpoznávání obrazu</full_dept> <full_dept>Department of Pattern Recognition</full_dept> <department language="cz">RO</department> <department>RO</department> <institution>UTIA-B</institution> <full_dept>Department of Pattern Recognition</full_dept>  <fullinstit>Ústav teorie informace a automatizace AV ČR, v. v. i.</fullinstit> </author>   <source> <url>http://library.utia.cas.cz/separaty/2010/RO/haindl-a compound mrf texture model.pdf</url> </source>        <cas_special> <project> <project_id>1M0572</project_id> <agency>GA MŠk</agency> <ARLID>cav_un_auth*0001814</ARLID> </project> <project> <project_id>GA102/08/0593</project_id> <agency>GA ČR</agency> <ARLID>cav_un_auth*0239567</ARLID> </project> <project> <project_id>2C06019</project_id> <agency>GA MŠk</agency> <country>CZ</country> <ARLID>cav_un_auth*0216518</ARLID> </project> <research> <research_id>CEZ:AV0Z10750506</research_id> </research>  <abstract language="eng" primary="1">This paper describes a novel compound Markov random field model capable of realistic modelling of multispectral bidirectional texture function, which is currentl the most advanced representation of visual properties of surface materials. The proposed compound Markov random field model combines a non-parametric control random field with analytically solvable widesense Markov representation for single regions and thus allows to avoid demanding Markov Chain Monte Carlo methods for both parameters estimation and the compound  random field synthesis.</abstract>  <action target="WRD"> <ARLID>cav_un_auth*0263643</ARLID> <name>20th International Conference on Pattern Recognition ICPR 2010</name> <place>Istanbul</place> <dates>23.08.2010-26.08.2010</dates>  <country>TR</country> </action>    <reportyear>2011</reportyear>  <RIV>BD</RIV>      <permalink>http://hdl.handle.net/11104/0187562</permalink>         <unknown tag="mrcbT16-q">50</unknown> <unknown tag="mrcbT16-s">0.420</unknown> <unknown tag="mrcbT16-y">10.52</unknown> <unknown tag="mrcbT16-x">0.85</unknown> <arlyear>2010</arlyear>       <unknown tag="mrcbU63"> cav_un_epca*0346559 20th   International Conference on Pattern Recognition 978-1-4244-7542-1 1051-4651 1792 1795 Los Alamitos IEEE Computer Society CPS 2010 </unknown> </cas_special> </bibitem>