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<bibitem type="C">   <ARLID>0411313</ARLID> <utime>20240103182317.7</utime><mtime>20060210235959.9</mtime>    <ISBN>963-9364-48-7</ISBN>         <title language="eng" primary="1">Fault classification for self-checking circuits implemented in FPGA</title>  <publisher> <place>Sopron</place> <name>University of West Hungary</name> <pub_time>2005</pub_time> </publisher> <specification> <page_count>4 s.</page_count> </specification>   <serial><title>Proceedings of the 8th IEEE Workshop on Design and Diagnostics of Electronics Circuits and Systems</title><part_num/><part_title/><page_num>228-231</page_num><editor><name1>Takách</name1><name2>G.</name2></editor><editor><name1>Hlawiczka</name1><name2>A.</name2></editor><editor><name1>Sziray</name1><name2>J.</name2></editor></serial>   <title language="cze" primary="0">Klasifikace poruch pro samočinně kontrolované obvody</title>    <keyword>concurrent error detection</keyword>   <keyword>FPGA</keyword>   <keyword>ED codes</keyword>    <author primary="1"> <ARLID>cav_un_auth*0202863</ARLID> <name1>Kafka</name1> <name2>Leoš</name2> <institution>UTIA-B</institution>  <fullinstit>Ústav teorie informace a automatizace AV ČR, v. v. i.</fullinstit> </author> <author primary="0"> <ARLID>cav_un_auth*0213175</ARLID> <name1>Kubalík</name1> <name2>P.</name2> <country>CZ</country>  </author> <author primary="0"> <ARLID>cav_un_auth*0213176</ARLID> <name1>Kubátová</name1> <name2>H.</name2> <country>CZ</country>  </author> <author primary="0"> <ARLID>cav_un_auth*0045825</ARLID> <name1>Novák</name1> <name2>O.</name2> <country>CZ</country>  </author>     <COSATI>09G</COSATI> <COSATI>09H</COSATI>    <cas_special> <project> <project_id>GA102/04/2137</project_id> <agency>GA ČR</agency> <ARLID>cav_un_auth*0004198</ARLID> </project> <research> <research_id>CEZ:AV0Z10750506</research_id> </research>  <abstract language="eng" primary="1">This work supports the design process of CED circuits implemented in FPGAs. We propose a new fault classification. We can summarize that our classification leads to a more accurate evaluation of the fault coverage, and we can determine whether the tested circuit satisfies the FS and ST properties. We can also evaluate how many considered faults violate the FS and ST property.</abstract> <abstract language="cze" primary="0">Článek se zabývá novou klasifikací poruch vhodnou pro samočinně kontrolované obvody. Poruchy jsou rozděleny podle jejich vlivu na bezpečnost proti poruchám a samočinnou kontrolu obvodu, a tak, na rozdíl od běžné klasifikace poruch, umožňuje přesněji vyhodnotit vlastnosti obvodu.</abstract>  <action target="EUR"> <ARLID>cav_un_auth*0213177</ARLID> <name>IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop /8./</name> <place>Sopron</place> <country>HU</country> <dates>13.04.2005-16.04.2005</dates>  </action>     <RIV>JC</RIV> <reportyear>2006</reportyear>   <department>ZS</department>    <permalink>http://hdl.handle.net/11104/0131396</permalink>    <ID_orig>UTIA-B 20050041</ID_orig>    <arlyear>2005</arlyear>       <unknown tag="mrcbU10"> 2005 </unknown> <unknown tag="mrcbU10"> Sopron University of West Hungary </unknown> <unknown tag="mrcbU12"> 963-9364-48-7 </unknown> <unknown tag="mrcbU63"> Proceedings of the 8th IEEE Workshop on Design and Diagnostics of Electronics Circuits and Systems 228 231 </unknown> <unknown tag="mrcbU67"> Takách G. 340 </unknown> <unknown tag="mrcbU67"> Hlawiczka A. 340 </unknown> <unknown tag="mrcbU67"> Sziray J. 340 </unknown> </cas_special> </bibitem>