0457068 20240111140916.720160415235959.9 85046057678 6 s. E cav_un_epca*04570672470-1173Measuring, Modeling, and Reproducing Material Appearance 2016SpringfieldSociety for Imaging Science and Technology2016ImaiF.Ortiz SegoviaM.UrbanP. BRDF stencil anisotropic interpolation cav_un_auth*0282273 Department of Pattern Recognition 50 Vávra Radomír UTIA-B Rozpoznávání obrazu Department of Pattern Recognition RO RO Ústav teorie informace a automatizace AV ČR, v. v. i. cav_un_auth*0101086 Department of Pattern Recognition 50 Filip Jiří UTIA-B Rozpoznávání obrazu Department of Pattern Recognition RO RO Ústav teorie informace a automatizace AV ČR, v. v. i. hypertextový soubor PDF http://library.utia.cas.cz/separaty/2016/RO/vavra-0457068.pdf 4MB cav_un_auth*0303412 GA14-02652S GA ČR CZ Fast and reliable measurement of material appearance is crucial for many applications ranging from virtual prototyping to visual quality control. The most common appearance representation is BRDF capturing illumination- and viewing-dependent reflectance. One of the approaches to rapid BRDF measurement captures its subspace, using so called slices, by continuous movements of a light and camera in azimuthal directions, while their elevations remain fixed. This records set of slices in the BRDF space while remaining data are unknown. We present a novel approach to BRDF reconstruction based on a concept of anisotropic stencils interpolating values along predicted locations of anisotropic highlights. Our method marks an improvement over the original linear interpolation method, and thus we ascertain it to be a promising variant of interpolation from such sparse yet very effective measurements. cav_un_auth*0328655 IS&T International Symposium on Electronic Imaging 2016, Measuring, Modeling, and Reproducing Material Appearance 2016 14.2.2016-18.2.2016 San Francisco US BD 2017 2 PR RVO:67985556 http://hdl.handle.net/11104/0258929 1 S 2016 85046057678 SCOPUS hypertextový soubor PDF 4MB cav_un_epca*0457067 IS&T International Symposium on Electronic Imaging 2016 Measuring, Modeling, and Reproducing Material Appearance 2016 2470-1173 MMRMA-356.1-MMRMA-356.6 Springfield Society for Imaging Science and Technology 2016 Imai F. 340 Ortiz Segovia M. 340 Urban P. 340