bibtype |
C -
Conference Paper (international conference)
|
ARLID |
0333259 |
utime |
20240111140730.0 |
mtime |
20091210235959.9 |
title
(primary) (eng) |
Space-variant deblurring using one blurred and one underexposed image |
specification |
page_count |
4 s. |
media_type |
www |
|
serial |
ARLID |
cav_un_epca*0333251 |
ISBN |
978-1-4244-5655-0 |
ISSN |
1522-4880 |
title
|
Proceedings of the IEEE 16th International Conference on Image Processing ICIP 2009 |
page_num |
157-160 |
publisher |
place |
Cairo |
name |
IEEE |
year |
2009 |
|
|
title
(cze) |
Odstraňování proměnného rozmazání pomocí rozmazaného a podexponovaného snímku |
keyword |
space-variant blind deconvolution |
keyword |
long/short exposure |
author
(primary) |
ARLID |
cav_un_auth*0108377 |
name1 |
Šorel |
name2 |
Michal |
institution |
UTIA-B |
full_dept |
Department of Image Processing |
fullinstit |
Ústav teorie informace a automatizace AV ČR, v. v. i. |
|
author
|
ARLID |
cav_un_auth*0101209 |
name1 |
Šroubek |
name2 |
Filip |
institution |
UTIA-B |
full_dept |
Department of Image Processing |
fullinstit |
Ústav teorie informace a automatizace AV ČR, v. v. i. |
|
source |
|
cas_special |
project |
project_id |
1M0572 |
agency |
GA MŠk |
ARLID |
cav_un_auth*0001814 |
|
project |
project_id |
GA102/08/1593 |
agency |
GA ČR |
ARLID |
cav_un_auth*0239572 |
|
research |
CEZ:AV0Z10750506 |
abstract
(eng) |
We perform space-variant blind deconvolution using one blurred image and one underexposed noisy image. |
abstract
(cze) |
Slepá dekonvoluce obrázku s prostorově proměnnou maskou s využitím jednoho podexponovaného obrázku. |
action |
ARLID |
cav_un_auth*0256726 |
name |
2009 IEEE 16th International Conference on Image Processing ICIP 2009 |
place |
Cairo |
dates |
07.11.2009-10.11.2009 |
country |
EG |
|
reportyear |
2010 |
RIV |
JD |
permalink |
http://hdl.handle.net/11104/0178290 |
arlyear |
2009 |
mrcbU56 |
pdf 830kB |
mrcbU63 |
cav_un_epca*0333251 Proceedings of the IEEE 16th International Conference on Image Processing ICIP 2009 978-1-4244-5655-0 1522-4880 157 160 Cairo IEEE 2009 |
|