bibtype C - Conference Paper (international conference)
ARLID 0346562
utime 20240103193759.1
mtime 20100907235959.9
DOI 10.1109/ICPR.2010.442
title (primary) (eng) A Compound MRF Texture Model
specification
page_count 4 s.
serial
ARLID cav_un_epca*0346559
ISBN 978-1-4244-7542-1
ISSN 1051-4651
title 20th International Conference on Pattern Recognition
page_num 1792-1795
publisher
place Los Alamitos
name IEEE Computer Society CPS
year 2010
keyword compound Markov random field
keyword bidirectional texture function
author (primary)
ARLID cav_un_auth*0101093
name1 Haindl
name2 Michal
full_dept (cz) Rozpoznávání obrazu
full_dept (eng) Department of Pattern Recognition
department (cz) RO
department (eng) RO
institution UTIA-B
full_dept Department of Pattern Recognition
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
author
ARLID cav_un_auth*0101100
name1 Havlíček
name2 Vojtěch
full_dept (cz) Rozpoznávání obrazu
full_dept Department of Pattern Recognition
department (cz) RO
department RO
institution UTIA-B
full_dept Department of Pattern Recognition
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
source
url http://library.utia.cas.cz/separaty/2010/RO/haindl-a compound mrf texture model.pdf
cas_special
project
project_id 1M0572
agency GA MŠk
ARLID cav_un_auth*0001814
project
project_id GA102/08/0593
agency GA ČR
ARLID cav_un_auth*0239567
project
project_id 2C06019
agency GA MŠk
country CZ
ARLID cav_un_auth*0216518
research CEZ:AV0Z10750506
abstract (eng) This paper describes a novel compound Markov random field model capable of realistic modelling of multispectral bidirectional texture function, which is currentl the most advanced representation of visual properties of surface materials. The proposed compound Markov random field model combines a non-parametric control random field with analytically solvable widesense Markov representation for single regions and thus allows to avoid demanding Markov Chain Monte Carlo methods for both parameters estimation and the compound random field synthesis.
action
ARLID cav_un_auth*0263643
name 20th International Conference on Pattern Recognition ICPR 2010
place Istanbul
dates 23.08.2010-26.08.2010
country TR
reportyear 2011
RIV BD
permalink http://hdl.handle.net/11104/0187562
mrcbT16-q 50
mrcbT16-s 0.420
mrcbT16-y 10.52
mrcbT16-x 0.85
arlyear 2010
mrcbU63 cav_un_epca*0346559 20th International Conference on Pattern Recognition 978-1-4244-7542-1 1051-4651 1792 1795 Los Alamitos IEEE Computer Society CPS 2010