bibtype C - Conference Paper (international conference)
ARLID 0360082
utime 20240103195233.3
mtime 20111031235959.9
WOS 000296062401119
DOI 10.1109/ICASSP.2011.5946633
title (primary) (eng) Detection of Elliptical Particles in Atomic Force Microscopy Images
specification
page_count 4 s.
serial
ARLID cav_un_epca*0360081
ISBN 978-1-4577-0539-7
title ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing
page_num 1233-1236
publisher
place Praha
name IEEE
year 2011
keyword particles detection
keyword atomic force microscopy (AFM) imaging
keyword watershed segmentation
keyword image moments
keyword approximation by ellipses
author (primary)
ARLID cav_un_auth*0239988
name1 Sedlář
name2 Jiří
full_dept (cz) Zpracování obrazové informace
full_dept (eng) Department of Image Processing
department (cz) ZOI
department (eng) ZOI
institution UTIA-B
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
author
ARLID cav_un_auth*0101238
name1 Zitová
name2 Barbara
full_dept (cz) Zpracování obrazové informace
full_dept Department of Image Processing
department (cz) ZOI
department ZOI
institution UTIA-B
full_dept Department of Image Processing
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
author
ARLID cav_un_auth*0215563
name1 Kopeček
name2 Jaromír
full_dept (cz) Funkční materiály
full_dept Functional materials
institution FZU-D
full_dept Functional Metal Materials and Thin Films
fullinstit Fyzikální ústav AV ČR, v. v. i.
author
ARLID cav_un_auth*0275385
name1 Todorciuc
name2 T.
country CZ
author
ARLID cav_un_auth*0100323
name1 Kratochvílová
name2 Irena
full_dept (cz) Funkční materiály
full_dept Functional materials
institution FZU-D
full_dept Fabrication and Analysis of Functional Materials
fullinstit Fyzikální ústav AV ČR, v. v. i.
source
url http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy images.pdf
cas_special
project
project_id 1M0572
agency GA MŠk
ARLID cav_un_auth*0001814
project
project_id GA203/08/1594
agency GA ČR
ARLID cav_un_auth*0240400
project
project_id KAN401770651
agency GA AV ČR
ARLID cav_un_auth*0217530
project
project_id GAP103/11/1552
agency GA ČR
ARLID cav_un_auth*0273618
research CEZ:AV0Z10750506
research CEZ:AV0Z10100520
abstract (eng) In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; the measured heights are represented by pixel values. Each sample in our project consisted of elliptical particles of principally the same size; the size could be characterized by the average length and width of a number of salient particles. The method we proposed is based on segmentation of undamaged particles and their approximation by ellipses; the major and minor axes provide robust estimates of the lengths and widths of the particles, respectively. The method is robust to distortions typical of AFM images. Its performance was demonstrated on images of pyrroles and compared with manual detection. Results show that the automatic method could be used in place of the time-consuming manual detection.
action
ARLID cav_un_auth*0272365
name ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing
place Praha
dates 22.05.2011-27.05.2011
country CZ
reportyear 2012
RIV IN
permalink http://hdl.handle.net/11104/0197718
arlyear 2011
mrcbU34 000296062401119 WOS
mrcbU63 cav_un_epca*0360081 ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing 978-1-4577-0539-7 1233 1236 Praha IEEE 2011