bibtype C - Conference Paper (international conference)
ARLID 0443579
utime 20240111140901.8
mtime 20150526235959.9
WOS 000354102200021
SCOPUS 84928491965
DOI 10.1117/12.2078361
title (primary) (eng) Anisotropic Materials Appearance Analysis using Ellipsoidal Mirror
specification
page_count 10 s.
media_type E
serial
ARLID cav_un_epca*0444227
ISBN 978-1-62841-488-2
ISSN 0277-786X
title Measuring, Modeling, and Reproducing Material Appearance 2015
publisher
place Bellingham
name SPIE-IS&T
year 2015
keyword BRDF
keyword anisotropy detection
keyword setup
keyword ellipsoidal mirror
author (primary)
ARLID cav_un_auth*0101086
name1 Filip
name2 Jiří
full_dept (cz) Rozpoznávání obrazu
full_dept (eng) Department of Pattern Recognition
department (cz) RO
department (eng) RO
institution UTIA-B
full_dept Department of Pattern Recognition
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
author
ARLID cav_un_auth*0282273
name1 Vávra
name2 Radomír
full_dept (cz) Rozpoznávání obrazu
full_dept Department of Pattern Recognition
department (cz) RO
department RO
institution UTIA-B
full_dept Department of Pattern Recognition
fullinstit Ústav teorie informace a automatizace AV ČR, v. v. i.
source
url http://library.utia.cas.cz/separaty/2015/RO/filip-0443579.pdf
source_size 6MB
cas_special
project
project_id GA14-02652S
agency GA ČR
country CZ
ARLID cav_un_auth*0303412
abstract (eng) Many real-world materials exhibit significant changes in appearance when rotated along a surface normal. The presence of this behavior is often referred to as visual anisotropy. Anisotropic appearance of spatially homogeneous materials is commonly characterized by a four-dimensional BRDF. Unfortunately, due to simplicity most past research has been devoted to three dimensional isotropic BRDFs. In this paper, we introduce an innovative, fast, and inexpensive image-based approach to detect the extent of anisotropy, its main axes and width of corresponding anisotropic highlights. The method does not rely on any moving parts and uses only an off-the-shelf ellipsoidal reflector with a compact camera. We analyze our findings with a material microgeometry scan, and present how results correspond to the microstructure of individual threads in a particular fabric. We show that knowledge of a material's anisotropic behavior can be effectively used in order to design a material-dependent sampling pattern so as the material's BRDF could be measured much more precisely in the same amount of time using a common gonioreflectometer.
action
ARLID cav_un_auth*0316990
name Electronic Imaging 2015
place San Francisco
dates 08.02.2015-12.02.2015
country US
reportyear 2016
RIV BD
presentation_type PR
inst_support RVO:67985556
permalink http://hdl.handle.net/11104/0246780
mrcbC61 1
confidential S
mrcbT16-s 0.223
mrcbT16-E Q4
arlyear 2015
mrcbU14 84928491965 SCOPUS
mrcbU34 000354102200021 WOS
mrcbU56 6MB
mrcbU63 cav_un_epca*0444227 Measuring, Modeling, and Reproducing Material Appearance 2015 978-1-62841-488-2 0277-786X 93980P-0-93980P-10 Bellingham SPIE-IS&T 2015 Proceedings of SPIE 9398